Patent · US Expired

Structurally-stabilized capacitors and method of making of same

US6667502B1 · kind B1 · utility

109Cited by
7References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 1, 2000
Grant dateDec 23, 2003
Priority date
Expiry dateFeb 1, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/10
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Structurally-stable, tall capacitors having unique three-dimensional architectures for semiconductor devices are disclosed. The capacitors include monolithically-fabricated upright microstructures, i.e., those having large height/width (H/W) ratios, which are mechanical reinforcement against shear forces and the like, by a brace layer that transversely extends between lateral sides of at least two of the free-standing microstructures. The brace layer is formed as a microbridge type structure spanning between the upper ends of the two or more microstructures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.