Patent · US Expired

Hierarchical verification for equivalence checking of designs

US6668362B1 · kind B1 · utility

22Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 9, 2002
Grant dateDec 23, 2003
Priority date
Expiry dateMar 20, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3323
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for determining equivalence between two integrated circuit device designs. Functional blocks and compare points within a first design are compared with functional blocks and compare points in a second design to determine compare points that are matched. The integrated circuit designs are traversed net-wise and cut points are inserted at compare points that are matched and that are not determined to be constant. As each design is traversed, the design is flattened such that flat copies of both integrated circuit designs are obtained (that include the inserted cut points). The flat copies of the integrated circuit designs are then compared to determine equivalence.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.