Patent · US Expired

Systems and methods for processing workpieces

US6668844B2 · kind B2 · utility

6Cited by
13References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 16, 2001
Grant dateDec 30, 2003
Priority date
Expiry dateSep 24, 2021

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

Workpieces requiring low levels of contamination, such as semiconductor wafers, are loaded into a rotor within a process chamber. The process chamber has a horizontal drain opening in its cylindrical wall. The chamber is closed via a door. A process or rinsing liquid is introduced into the chamber. The liquid rises to a level so that the workpieces are immersed in the liquid. The chamber slowly pivots or rotates to move the drain opening down to the level of the liquid. The liquid drains out through the drain opening. The drain opening is kept near the surface of the liquid to drain off liquid at a uniform rate. An organic solvent vapor is introduced above the liquid to help prevent droplets of liquid from remaining on the workpieces as the liquid drains off. The rotor spins the workpieces to help to remove any remaining droplets by centrifugal force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.