Patent · US Expired

Single and multilevel rework

US6674168B1 · kind B1 · utility

10Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 21, 2003
Grant dateJan 6, 2004
Priority date
Expiry dateJan 21, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of reworking BEOL (back end of a processing line) metallization levels of damascene metallurgy comprises forming a plurality of BEOL metallization levels over a substrate, forming line and via portions in the BEOL metallization levels, selectively removing at least one of the BEOL metallization levels to expose the line and via portions, and replacing the removed BEOL metallization levels with at least one new BEOL metallization level, wherein the BEOL metallization levels comprise a first dielectric layer and a second dielectric layer, and wherein the first dielectric layer comprising a lower dielectric constant material than the second dielectric layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.