Patent · US Expired

Method and apparatus for SoC design validation

US6678645B1 · kind B1 · utility

164Cited by
8References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 1999
Grant dateJan 13, 2004
Priority date
Expiry dateOct 28, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/33
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for validating SoC (system-on-a-chip) design with high accuracy and speed and low cost. The [apparatus allows to use a] method [which] includes the steps of verifying individual cores to be integrated in an SoC by evaluating a silicon IC having a function and structure identical to that of each core constituting the SoC with use of test patterns generated based on simulation testbenches produced through a design stage of the cores; verifying interfaces between the individual cores, on-chip buses of the cores and glue logic by using the silicon ICs and simulation testbenches [developed by an SoC designer] and FPGA/emulation of the glue logic; verifying core-to-core timings and SoC level timing critical paths; and performing an overall design validation by using the silicon ICs and simulation testbenches of [an] the overall SoC [and application runs].

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.