Patent · US Expired

Trench IGBT

US6683331B2 · kind B2 · utility

6Cited by
3References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 25, 2002
Grant dateJan 27, 2004
Priority date
Expiry dateJul 9, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/393

Abstract

An IGBT has parallel spaced trenches lined with gate oxide and filled with conductive polysilicon gate bodies. The trenches extend through a P− base region which is about 7 microns deep. A deep narrow N+ emitter diffusion is at the top of the trench and a shallow P+ contact diffusion extends between adjacent emitter diffusions. The N+ emitter diffusions are arranged to define a minimum RB′. The trenches are sufficiently deep to define long channel regions which can withstand a substantial portion of the blocking voltage of the device. A second blanket emitter implant and diffusion defines a shallow high concentration emitter diffusion extension at the top of the die for improved contact to the emitter diffusions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.