Patent · US Expired

Method of simultaneously polishing a plurality of objects of a similar type, in particular silicon wafers, on a polishing installation

US6689691B2 · kind B2 · utility

2Cited by
8References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 8, 2002
Grant dateFeb 10, 2004
Priority date
Expiry dateJun 21, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The method allows simultaneous polishing of a plurality of objects of a similar type, preferably silicon wafers. The polishing process is interrupted briefly at least once. During the polishing pause, the carriers on which the objects to be polished have been mounted are rotated onward sequentially and then the polishing operation is continued. The objects are mounted on one or more carriers which are at a free position during the polishing operation. This has the advantage that the polishing operation does not have to be additionally interrupted for the purpose of loading and unloading the carrier. This saves valuable machine time, so that the throughput is increased. At the same time, the fact that each wafer is processed at a plurality of polishing plates stabilizes the result of polishing, since the individual abrasion properties of the individual polishing plates are averaged out.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.