Patent · US Expired

Multi-bit PROM memory cell

US6690597B1 · kind B1 · utility

32Cited by
2References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 24, 2003
Grant dateFeb 10, 2004
Priority date
Expiry dateApr 24, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2216/26
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory cell comprises at least two antifuses in series with a diode. Each antifuse expresses a different resistance from the others when blown, and each requires an escalating programming voltage over the last to be programmed. The antifuse structures differ in their respective geometries and materials so that a low programming voltage will blow the more sensitive fuse first, and a higher voltages will program the lesser sensitive fuses thereafter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.