Craig Perlov
19Patents
9h-index
20Co-inventors
72Inventor score
Filing activity: Mar 20, 1986 → Oct 1, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5557596A | Ultra-high density storage device | Emerging Cross-Sectional Technologies | 148 | Expired |
| US6887792B2 | Embossed mask lithography | Emerging Cross-Sectional Technologies | 41 | Expired |
| US6646912B2 | Non-volatile memory | Physics | 40 | Expired |
| US6690597B1 | Multi-bit PROM memory cell | Physics | 32 | Expired |
| US6683322B2 | Flexible hybrid memory element | Electricity | 28 | Expired |
| US4748525A | Probe head for vertical recording | Physics | 27 | Expired |
| US6813182B2 | Diode-and-fuse memory elements for a write-once memory comprising an anisotropic semiconductor sheet | Electricity | 11 | Expired |
| US7541227B2 | Thin film devices and methods for forming the same | Electricity | 10 | Active |
| US4897749A | Combination probe and ring head for vertical recording | Physics | 10 | Expired |
| US4667260A | Thin film vertical recording head | Physics | 9 | Expired |
| US6919633B2 | Multi-section foldable memory device | Electricity | 7 | Expired |
| US4788612A | Extended metal in gap head | Physics | 5 | Expired |
| US7678626B2 | Method and system for forming a thin film device | Electricity | 3 | Active |
| US8021935B2 | Thin film device fabrication process using 3D template | Emerging Cross-Sectional Technologies | 3 | Active |
| US7084007B2 | Fabrication and assembly structures and methods for memory devices | Electricity | 1 | Expired |
| US7304364B2 | Embossed mask lithography | Emerging Cross-Sectional Technologies | 1 | Expired |
| US6864576B2 | Large line conductive pads for interconnection of stackable circuitry | Electricity | 0 | Expired |
| US7199025B2 | Fabrication and assembly structures and methods for memory devices | Electricity | 0 | Expired |
| US6867132B2 | Large line conductive pads for interconnection of stackable circuitry | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.