Patent · US Expired

Electrical circuit and method for testing a circuit component of the electrical circuit

US6701473B2 · kind B2 · utility

4Cited by

5References

38Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Aaron Nygren · Birkenfeld, DE
Eckehard Plättner · Hersbruck, DE
Andreas Täuber · Unterschleißheim, DE

Key dates

Filing date	Jan 26, 2001
Grant date	Mar 2, 2004
Priority date	—
Expiry date	Aug 5, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318505
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The electrical circuit includes a plurality of circuit components which are connected via a bus. At least one of the circuit components can be tested independently of the other circuit components. The circuit component which is to be tested and the method for testing the circuit component are distinguished in that steps are taken to ensure that, during testing, the circuit component which is tested, outputs no data to the bus, and/or instead of the data which would need to be output to the bus during normal operation, outputs other data to the bus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.