Deterministic random LBIST
US6708305B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2000 |
| Grant date | Mar 16, 2004 |
| Priority date | — |
| Expiry date | Mar 6, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Deterministic random Logic Built In Self Test (LBIST) is disclosed that applies Deterministic Stored Pattern Tests (DSPTs) by using random LBIST. Basically, the present invention selects the appropriate pseudorandom pattern for use with a scan cycle that needs care bits. The scan cycle may be a current or future scan cycle. In particular, the present invention determines care bits for a particular scan cycle. A pseudorandom pattern is generated that is then aligned with the particular scan cycle. If the pseudorandom pattern contains the care bits, with the correct values and in the proper positions within the pattern, this alignment tests one or more logic devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.