Thomas J. Snethen
4Patents
3h-index
8Co-inventors
47Inventor score
Filing activity: May 8, 1974 → Jun 20, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US3961250A | Logic network test system with simulator oriented fault test generator | Physics | 41 | Expired |
| US6708305B1 | Deterministic random LBIST | Physics | 13 | Expired |
| US5691990A | Hybrid partial scan method | Physics | 10 | Expired |
| US7587646B1 | Test pattern generation in residue networks | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.