High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile

US6717670B2 · kind B2 · utility

Assignees

• Gesellschaft zur Förderung der Spektrochemie und angewandten Spektroskopie e.V. · DE
• Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. · DE

Inventors

• Helmut Becker-Ross · Berlin, DE
• Stefan Florek · Berlin, DE
• Michael Okruss · Potsdam, DE

Key dates

• Filing date: Jun 20, 2002
• Grant date: Apr 6, 2004
• Expiry date: Jun 25, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J3/18
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).