Patent · US Expired

Insulation film forming material, insulation film, method for forming the insulation film, and semiconductor device

US6727515B2 · kind B2 · utility

7Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 2002
Grant dateApr 27, 2004
Priority date
Expiry dateMay 25, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Porous insulation films 28, 40, 50 are formed of an insulation forming material including a silicon compound having a skeleton containing C—C bonds, a pore forming compound which is decomposed or evaporated by a heat treatment, and a solvent which dissolves the silicon compound with the pore forming compound, whereby the porous insulation film can have good mechanical strength and low dielectric constant.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.