Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit

US6728902B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Robert Kaiser · Kaufering, DE
• Florian Schamberger · Bad Reichenhall, DE

Key dates

• Filing date: Jan 23, 2001
• Grant date: Apr 27, 2004
• Expiry date: Aug 22, 2022

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31813
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit includes a self-test device which is provided for executing a self-test of the integrated circuit and which has a control output. A program memory is connected to the self-test device for storing at least one test program supplied from outside the integrated circuit. The test program is run by the self-test device during execution of a self-test. The self-test device controls loading of a respective test program to be run into the program memory from outside the integrated circuit through the control output thereof.