Robert Kaiser
44Patents
10h-index
23Co-inventors
75Inventor score
Filing activity: Apr 19, 1985 → May 5, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6728902B2 | Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit | Physics | 64 | Expired |
| US6560134B2 | Memory configuration with a central connection area | Electricity | 47 | Expired |
| US5647386A | Automatic precision cleaning apparatus with continuous on-line monitoring and feedback | Emerging Cross-Sectional Technologies | 41 | Expired |
| US5536327A | Removal of hydrocarbon or fluorocarbon residues using coupling agent additives | Chemistry; Metallurgy | 24 | Expired |
| US4711256A | Method and apparatus for removal of small particles from a surface | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6053952A | Method of dry cleaning using a highly fluorinated organic liquid | Chemistry; Metallurgy | 15 | Expired |
| US6404690B2 | Refresh drive circuit for a DRAM | Physics | 12 | Expired |
| US8855740B1 | System and method for determining size and size distribution of magnetic nanoparticles using VSM magnetization data | Physics | 10 | Active |
| US6415406B1 | Integrated circuit having a self-test device and method for producing the integrated circuit | Physics | 10 | Expired |
| US6178124A | Integrated memory having a self-repair function | Physics | 10 | Expired |
| US6868028B2 | Circuit configuration for driving a programmable link | Physics | 10 | Expired |
| US6353357B1 | Controlling transistor threshold potentials using substrate potentials | Electricity | 9 | Expired |
| US7163589B2 | Method and apparatus for decontamination of sensitive equipment | Performing Operations; Transporting | 7 | Expired |
| US6552549B1 | Method of reading electrical fuses/antifuses | Physics | 6 | Expired |
| US8260086B2 | System and method for fusion of image pairs utilizing atmospheric and solar illumination modeling | Physics | 6 | Active |
| US5733416A | Process for water displacement and component recycling | Performing Operations; Transporting | 6 | Expired |
| US7181643B2 | Method for comparing the address of a memory access with an already known address of a faulty memory cell | Physics | 6 | Expired |
| US8700124B2 | System and method for determining size and size distribution of magnetic nanoparticles using VSM magnetization data | Physics | 4 | Active |
| US6535046B2 | Integrated semiconductor circuit with an increased operating voltage | Electricity | 4 | Expired |
| US7034559B2 | Integrated test circuit in an integrated circuit | Physics | 4 | Expired |
| US6800817B2 | Semiconductor component for connection to a test system | Physics | 3 | Expired |
| US7047454B2 | Integrated circuit having a data processing unit and a buffer memory | Physics | 3 | Expired |
| US7398444B2 | Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods | Physics | 2 | Active |
| US7494629B2 | Decontamination system | Emerging Cross-Sectional Technologies | 2 | Active |
| US6807123B2 | Circuit configuration for driving a programmable link | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.