Patent · US Expired

Semiconductor memory array of floating gate memory cells with horizontally oriented floating gate edges

US6756633B2 · kind B2 · utility

296Cited by
26References
44Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 2002
Grant dateJun 29, 2004
Priority date
Expiry dateJun 25, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/6891

Abstract

A self aligned method of forming an array of floating gate memory cells, and an array formed thereby, wherein each memory cell includes a trench formed into a surface of a semiconductor substrate, and spaced apart source and drain regions with a channel region formed therebetween. The drain region is formed underneath the trench. An electrically conductive floating gate is formed over and insulated from a portion of the channel region, with a horizontally oriented edge extending therefrom. An electrically conductive control gate is formed having a first portion disposed in the trench and a second portion disposed adjacent to and insulated from the floating gate edge.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.