Semiconductor component and corresponding test method
US6762440B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2002 |
| Grant date | Jul 13, 2004 |
| Priority date | — |
| Expiry date | Sep 25, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/106
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor component having a first main terminal, a second main terminal, a gate terminal for controlling the current between the main terminals is provided. A first diode device can be switched between the first main terminal and the gate terminal. The first diode device has a first breakdown voltage such that the first diode device short-circuits the first main terminal with the gate terminal, thereby switching on the semiconductor component, when the voltage that drops off over the first diode device exceeds a certain predetermined value. The first diode device is connected to the control gate in an integrated manner and has an external contacting area for connecting to the first main terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.