Patent · US Expired

Processing tester information by trellising in integrated circuit technology development

US6766265B2 · kind B2 · utility

0Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 2002
Grant dateJul 20, 2004
Priority date
Expiry dateDec 18, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T11/206
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for processing tester information is provided. The number of clusters of data in the tester information is determined to determine the number of data clusters. A basis is determined from the tester information to be used for plotting the data clusters. The data clusters are plotted on a plurality of trellis charts to form a trellising plot with a trellis of trellis charts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.