Patent · US Expired

Processing apparatus including a reactor for electrochemically etching a microelectronic workpiece

US6773559B2 · kind B2 · utility

13Cited by
26References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 13, 2001
Grant dateAug 10, 2004
Priority date
Expiry dateDec 2, 2021

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC25D7/123
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Although there are several inventions disclosed herein, the present application is directed to a reactor for electrochemically processing a microelectronic workpiece. The reactor comprises a movable electrode assembly that is disposed for movement along a motion path. The motion path includes at least a portion thereof over which the electrode assembly is positioned for processing at least one surface of the microelectronic workpiece. A cleaning electrode is located along the motion path of the movable electrode assembly. In one embodiment, a programmable controller is connected to direct the movable electrode assembly to move to the cleaning electrode during a cleaning cycle. At that time, the programmable controller connects the movable electrode assembly as an anode and the cleaning electrode as a cathode for cleaning of the movable electrode assembly. The cleaning electrode may be disposed along a position of the motion path that is beyond the range of motion required to process the microelectronic workpiece so that the programmable controller may be programmed to conduct a cleaning cycle while a microelectronic workpiece is present in the reactor for processing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.