Patent · US Expired

Ferroelectric semiconductor memory device and a fabrication process thereof

US6777287B2 · kind B2 · utility

1Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 23, 2003
Grant dateAug 17, 2004
Priority date
Expiry dateMay 23, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/682
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A ferroelectric random access memory has a ferroelectric capacitor formed of a stacking of a lower electrode, a PZT film and an upper electrode of SrRuO3, wherein the PZT film includes pinholes, with a pinhole density of about 17 &mgr;m2 or less.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.