Method and magazine device for testing semiconductor devices

US6777924B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Bjorn Flach · Munich, DE
• Wolfgang Ruf · Friedberg, DE
• Martin Schnell · Berlin, DE
• Jörg Stippler · Hersbruck, DE
• Andreas Logisch · Hersbruck, DE

Key dates

• Filing date: Feb 28, 2003
• Grant date: Aug 17, 2004
• Expiry date: Feb 28, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2853
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.