Andreas Logisch
5Patents
3h-index
7Co-inventors
39Inventor score
Filing activity: Jul 30, 2002 → Nov 30, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6759854B2 | Test apparatus for testing devices under test and method for transmitting a test signal | Physics | 6 | Expired |
| US6777924B2 | Method and magazine device for testing semiconductor devices | Physics | 5 | Expired |
| US7360139B2 | Semiconductor component, arrangement and method for characterizing a tester for semiconductor components | Physics | 3 | Expired |
| US7414421B2 | Insertable calibration device | Physics | 1 | Expired |
| US7426669B2 | Circuit arrangement and method for driving electronic chips | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.