Patent · US Expired

Nanotube tip for atomic force microscope

US6780664B1 · kind B1 · utility

10Cited by
8References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 20, 2002
Grant dateAug 24, 2004
Priority date
Expiry dateDec 20, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/876
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Various microscopy probes and methods of fabricating the same are provided. In one aspect, a method of fabricating a microscopy probe is provided that includes providing a member and forming a first film on the member. The first film fosters growth of carbon nanotubes when exposed to a carbon-containing compound. A second film is formed on the first film. The second film has an opening therein that exposes a portion of the first film. A carbon nanotube is formed on the exposed portion of the first film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.