Patent · US Expired

Memory cell sensing integrator

US6781906B2 · kind B2 · utility

57Cited by
4References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 2002
Grant dateAug 24, 2004
Priority date
Expiry dateNov 19, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2207/2254
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory cell sensor including an integrator for sensing a logical state of a memory cell. An integrator calibration circuit provides a corrective bias to the integrator, the corrective bias being based upon a difference between an initial integrator output value and a reference value. Another embodiment includes a method of sensing a logical state of a memory cell. The memory cell being sensed by an integrator. The method includes determining an initial integrator output value when a corrective bias of the integrator is zeroed, generating a correction value by comparing the initial integrator output value to a reference value, and applying the correction value to the corrective bias of the integrator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.