Graphical user interface for testing integrated circuits
US6782331B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 24, 2001 |
| Grant date | Aug 24, 2004 |
| Priority date | — |
| Expiry date | Oct 24, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system that includes a graphical user interface (GUI) connected to an input/output device of a computer system and one or more test instruments producing a set of electrical signals. The system also includes a probe card that has a multiple probe needles used for measuring electronic characteristics of each of the devices on a semiconductor wafer. Each device has cells. Each cell has a set of bond pads. The system also has a matrix switch and an interface conduit electrically connecting the one or more test instruments, the computer, the probe card, and the matrix switch together. The semiconductor wafer is moved so that the probe needles measure the electrical characteristics of each cell for each device selected for testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.