Kamel Ayadi
4Patents
3h-index
8Co-inventors
33Inventor score
Filing activity: Mar 23, 2001 → Feb 19, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6445630B2 | Method for carrying out a burn-in process for electrically stressing a semiconductor memory | Physics | 13 | Expired |
| US6458631B1 | Method for fabricating an integrated circuit, in particular an antifuse | Electricity | 9 | Expired |
| US6782331B2 | Graphical user interface for testing integrated circuits | Physics | 6 | Expired |
| US6768826B2 | Delivering data optically to an integrated circuit | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.