Patent · US Expired

Ferroelectric capacitor and process for its manufacture

US6785119B2 · kind B2 · utility

0Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 2002
Grant dateAug 31, 2004
Priority date
Expiry dateNov 29, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31116
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Forming a capacitor, by (a) forming a matrix of ferroelectric capacitor elements on a substrate, (b) forming a CAP layer over the ferroelectric capacitor elements, and (c) etching the CAP layer to a more uniform thickness. A capacitor that has a substrate layer, a matrix of ferroelectric capacitor elements including a first electrode layer substantially fixed relative to the substrate, a second electrode layer, and a ferroelectric layer sandwiched between the first and second electrode layers is disclosed. The capacitor has a shoulder layer extending from the substrate to the matrix, and a CAP layer etched to have substantially constant thickness covering sides of the matrix extending beyond the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.