Patent · US Expired

Semiconductor component for connection to a test system

US6800817B2 · kind B2 · utility

3Cited by

3References

9Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Helmut Schneider · Hersbruck, DE
Robert Kaiser · Kaufering, DE
Florian Schamberger · Bad Reichenhall, DE

Key dates

Filing date	Jan 23, 2002
Grant date	Oct 5, 2004
Priority date	—
Expiry date	Jan 8, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/48
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The semiconductor component is provided for connection to a test system. An external clock signal with a modulated duty ratio can be input to the semiconductor component at a connection provided for that purpose on the semiconductor component. The latter has a clock recovery circuit, which obtains a periodic clock signal from the modulated clock signal, and a shift register, to which the modulated clock signal can be fed in a manner clocked by the periodic clock signal and which provides a data signal. The present invention makes it possible, in particular in mass memory chips, to feed in clock signals and also program, address or data signals for the realization of BIST via just one connection contact.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.