Patent · US Expired

Calibration method for system performance validation of automatic test equipment

US6804620B1 · kind B1 · utility

17Cited by
2References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 2003
Grant dateOct 12, 2004
Priority date
Expiry dateMar 21, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31922
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An ATE calibration method and system that does not require external test equipment to calibrate individual functional pins and provides balanced timing skews among the functional pins and pincards is disclosed. A functional pin in the test system is selected as a reference or “golden” pin and another is selected as a precision measurement unit (PMU). External test equipment and the reference PMU are used to measure the AC and DC characteristics of the reference pin, and any deviation represents a measurement error in the reference PMU. All functional pins in the test system can be measured against the reference pin using the reference PMU, taking into account the measurement error, without the need for external test equipment. To ensure that skews are balanced among all pins, the location of the reference pin is selected to be as close as possible to the midpoint of the functional pin range.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.