Adaptive off tester screening method based on intrinsic die parametric measurements
US6807655B1 · kind B1 · utility
87Cited by
4References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 16, 2002 |
| Grant date | Oct 19, 2004 |
| Priority date | — |
| Expiry date | Sep 16, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/67017
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for adaptively providing parametric limits to identify defective die quantizes the die into a plurality of groups according to statistical distributions, such as intrinsic speed in one embodiment. For each quantization level, an intrinsic distribution of the parameter is derived. Adaptive screening limits are then set as a function of the intrinsic distribution. Dies are then screened according to their parametric values with respect to the adaptive limits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.