Spatial and spectral wavefront analysis and measurement
US6819435B2 · kind B2 · utility
8Cited by
19References
248Claims
0Family size
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Key dates
| Filing date | Apr 9, 2001 |
| Grant date | Nov 16, 2004 |
| Priority date | — |
| Expiry date | Feb 16, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/10009
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for wavefront analysis including obtaining a plurality of differently phase changed transformed wavefronts corresponding to a wavefront being analyzed which has an amplitude and a phase, obtaining a plurality of intensity maps of the plurality of phase changed transformed wavefronts and employing the plurality of intensity maps to obtain an output indicating the amplitude and phase of the wavefront being analyzed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.