Device for and method of testing semiconductor laser module
US6822984B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 14, 2002 |
| Grant date | Nov 23, 2004 |
| Priority date | — |
| Expiry date | Jul 5, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0687
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
In the semiconductor laser module testing device, a temperature control power source changes a temperature of a wavelength locker module, and a wavelength monitoring bias circuit detects an output of a wavelength monitor in the changed temperature range and computes a correlation between a temperature of a semiconductor laser and a wavelength of light output therefrom. Moreover, the wavelength of the output light is locked by controlling the temperature of the wavelength locker module while feeding back the output of the wavelength monitor by a wavelength feedback circuit based on the obtained correlation between the temperature and the wavelength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.