Push button mode automatic pattern switching for interconnect built-in self test

US6826100B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• David G. Ellis · Tualatin, US
• Bruce Querbach · Hillsboro, US
• Jay Nejedlo · Wilsonville, US
• Amjad Khan · Folsom, US
• Sean R. Babcock · Portland, US
• Eric S. Gayles · Milpitas, US
• Eshwar Gollapudi · Folsom, US

Key dates

• Filing date: Mar 31, 2003
• Grant date: Nov 30, 2004
• Expiry date: Apr 13, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/27
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A built-in self test (BIST) unit, of a primary integrated circuit (IC) component of a computer system, is programmed or hardwired with a test pattern. The test pattern is launched in multiple test cycles, to test an interconnect bus of the computer system or perform a device validation test of the component. A pin assignment of the pattern is automatically changed after each test cycle, without requiring re-programming of the BIST unit to do so.