Method and apparatus for calibrating a multiport test system for measurement of a DUT
US6826506B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2001 |
| Grant date | Nov 30, 2004 |
| Priority date | — |
| Expiry date | Dec 15, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenting three reflection standards with the automatic calibration device to each port of the N-port multiport test system. The method also consists of providing with the automatic calibration device, N−1 through conditions of a possible N(N−1)/2 possible through conditions, between corresponding ports of the N-port multiport test system, and making measurements with the N-port multiport test system of the three reflection standards at each port and the N−1 through conditions between the corresponding ports. The method further consists of determining all of systematic error coefficients for all of the ports of N-port multiport test system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.