Patent · US Expired

Methods of forming hemispherical grained silicon on a template on a semiconductor work object

US6828193B2 · kind B2 · utility

8Cited by
27References
42Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 18, 2002
Grant dateDec 7, 2004
Priority date
Expiry dateJul 3, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/716

Abstract

The present invention provides a method of preparing a surface of a silicon wafer for formation of HSG structures. The method contemplates providing a wafer having at least one HSG template comprising polysilicon formed in BPSG, the HSG template being covered by silicon dioxide. The wafer is treated with a cleaning agent to clean the surface of the wafer. Next, the wafer is treated with a conditioning agent. The conditioning agent removes native oxide from the HSG template without excessively etching structural BPSG. Preferably, the conditioning agent also removes a thin layer of polysilicon on the HSG template. The wafer is then transferred to a process chamber for HSG formation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.