Patent · US Expired

Optical testing device

US6836135B2 · kind B2 · utility

52Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 7, 2002
Grant dateDec 28, 2004
Priority date
Expiry dateFeb 26, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/311
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A chuck adapted to test electrical and/or optical components on a device-under-test (DUT).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.