Peter McCann
13Patents
8h-index
14Co-inventors
69Inventor score
Filing activity: May 3, 2000 → Oct 11, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6771090B2 | Indexing rotatable chuck for a probe station | Electricity | 57 | Expired |
| US6483336B1 | Indexing rotatable chuck for a probe station | Electricity | 53 | Expired |
| US6836135B2 | Optical testing device | Physics | 52 | Expired |
| US6885197B2 | Indexing rotatable chuck for a probe station | Electricity | 47 | Expired |
| US7298536B2 | Fiber optic wafer probe | Physics | 11 | Expired |
| US7420381B2 | Double sided probing structures | Physics | 8 | Expired |
| US7492172B2 | Chuck for holding a device under test | Physics | 8 | Expired |
| US8013623B2 | Double sided probing structures | Physics | 8 | Active |
| US7268533B2 | Optical testing device | Physics | 6 | Expired |
| US7876115B2 | Chuck for holding a device under test | Physics | 3 | Active |
| US10459006B2 | Probe systems and methods | Physics | 2 | Active |
| US6970634B2 | Fiber optic wafer probe | Physics | 1 | Expired |
| US11047879B2 | Probe systems and methods | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.