Method of forming semiconductor wiring structures
US6838376B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 1998 |
| Grant date | Jan 4, 2005 |
| Priority date | — |
| Expiry date | Nov 5, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of forming a barrier metal film formed of a nitride film including tungsten by thermal CVD. The method includes positioning a substrate in a processing vessel and forming a WSi film on one side of the substrate by supplying a process gas including WF6 gas and at least one of SiR4 gas, SiH2Cl2 gas and Si2H6 gas into the processing vessel while a processing pressure in the processing vessel is maintained. The method also includes shutting off the supplying of the process gas into the processing vessel and completely removing the process gas from the processing vessel by supplying a purging gas into the processing vessel after the shutting off the supplying. The WSi film is nitrided by supplying NH3 gas or MMH gas into the processing vessel from which the process gas has been removed, to form a WSixNy film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.