System and method for monitoring internal voltages on an integrated circuit
US6845048B2 · kind B2 · utility
3Cited by
9References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 25, 2002 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | Jan 21, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for monitoring internal voltage sources in an integrated circuit, such as a DRAM integrated circuit, includes an internal analog multiplexing circuit, an internal analog-to-digital converter, and an interface circuit. Through the analog multiplexing circuit, the analog-to-digital converter sequentially connects to each voltage source and converts the measured voltage level of the source to a binary word. The interface circuit presents the binary word, e.g., serially, to test equipment off the integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.