Inventor · Cary, NC, US

David Ma

17Patents
5h-index
12Co-inventors
55Inventor score

Filing activity: Jul 31, 2002 → Sep 24, 2007

Most-cited inventions

PatentTitleAreaCited byStatus
US7079441B1 Methods and apparatus for implementing a power down in a memory device Physics 77 Expired
US6721180B2 Cooling hood for circuit board Electricity 36 Expired
US7119567B2 System and method for testing one or more dies on a semiconductor wafer Physics 17 Expired
US7277350B2 Implementation of a fusing scheme to allow internal voltage trimming Physics 10 Expired
US7449909B2 System and method for testing one or more dies on a semiconductor wafer Physics 5 Active
US6667919B1 Semiconductor memory device and test method thereof using row compression test mode Physics 5 Expired
US6845048B2 System and method for monitoring internal voltages on an integrated circuit Physics 3 Expired
US7242208B2 System and method for testing one or more dies on a semiconductor wafer Physics 3 Expired
US6903982B2 Bit line segmenting in random access memories Physics 2 Expired
US7330040B2 Test circuitry wafer Physics 2 Expired
US6754113B2 Topography correction for testing of redundant array elements Physics 1 Expired
US7177373B2 Continuous self-calibration of internal analog signals Physics 1 Expired
US7539075B2 Implementation of a fusing scheme to allow internal voltage trimming Physics 1 Active
US7643956B2 Continuous self-calibration of internal analog signals Physics 1 Active
US6702589B1 Leadless socket for decapped semiconductor device Emerging Cross-Sectional Technologies 0 Expired
US7071724B2 Wafer probecard interface Physics 0 Expired
US7305594B2 Integrated circuit in a maximum input/output configuration Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.