Patent · US Expired

Reactor for depositing thin film on wafer

US6852168B2 · kind B2 · utility

14Cited by
21References
19Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 3, 2001
Grant dateFeb 8, 2005
Priority date
Expiry dateMay 4, 2021

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/45565
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A thin film deposition reactor including a reactor block on which a wafer is placed, a shower head plate for uniformly maintaining a predetermined pressure by covering the reactor block, a wafer block installed in the reactor block, on which the wafer is to be seated; an exhausting portion connected to the reactor block for exhausting a gas from the reactor block; a first connection line in communication with the shower head plate, through which a first reaction gas and/or inert gas flow, a second connection line in communication with the shower head plate, through which a second reaction gas and/or inert gas flow, and a diffusion plate mounted on a lower surface of the shower head plate. The diffusion plate has a plurality of spray holes which are in communication with the first connection line and face the upper surface of the wafer to spray the first reaction gas and/or inert gas onto the wafer, and a plurality of nozzles which are in communication with the second connection line and extend toward the inner side surface of the reactor block to spray the second reaction gas and/or inert gas toward edges of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.