Patent assignee · US · COMPANY

IPS Group Inc.

188Patents
151Active
188Granted
60Portfolio score

Filing activity: Sep 20, 1991 → Jul 7, 2023 · 43 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US6579372B2 Apparatus and method for depositing thin film on wafer using atomic layer deposition Emerging Cross-Sectional Technologies 131 Expired
US6183563A Apparatus for depositing thin films on semiconductor wafers Electricity 130 Expired
US7854310B2 Parking meter Physics 116 Active
USD575168S1 Parking meter General 104 Expired
USD587141S1 Parking meter General 104 Expired
US6231672A Apparatus for depositing thin films on semiconductor wafer by continuous gas injection Chemistry; Metallurgy 100 Expired
US8749403B2 Parking meter communications for remote payment with updated display Physics 93 Active
US7806248B2 System and method for coin validation Physics 85 Active
US8595054B2 Parking meter and a device therefor Physics 83 Active
US8590687B2 Parking meter Physics 82 Active
US8513832B2 Power supply unit Electricity 76 Active
US8862494B2 Parking meter and a device therefor Physics 72 Active
US8812471B2 Database, process flow data management server, and process flow data managing program product Physics 69 Active
USD707141S1 Parking meter General 68 Active
USD707140S1 Parking meter General 68 Active
USD707142S1 Parking meter General 68 Active
USD735440S1 Multispace parking pay station General 67 Active
US9127964B2 Low power vehicle detection Emerging Cross-Sectional Technologies 66 Active
USD735965S1 Multispace parking pay station General 66 Active
USD735963S1 Multispace parking pay station General 65 Active
US8479909B2 Coin validation unit with clip feature Physics 64 Active
USD748364S1 Multispace parking pay station General 63 Active
USD748888S1 Multispace parking pay station General 63 Active
USD735437S1 Multispace parking pay station General 63 Active
US8566159B2 Location-aware advertising to parking location users Physics 63 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.