Patent · US Expired

Multi-state memory

US6856546B2 · kind B2 · utility

137Cited by
101References
73Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 2001
Grant dateFeb 15, 2005
Priority date
Expiry dateJan 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5634
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.