Patent · US Expired

Method for testing semiconductor chips

US6858447B2 · kind B2 · utility

3Cited by

7References

7Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Udo Hartmann · Birkenfeld, DE
Jochen Kallscheuer · Birkenfeld, DE
Peter Beer · Waldshut-Tiengen, DE

Key dates

Filing date	May 21, 2002
Grant date	Feb 22, 2005
Priority date	—
Expiry date	May 21, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG06F2201/83
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for testing semiconductor chips, in particular semiconductor memory chips, is described. In which, in a chip to be tested, at least one test mode is set, the test mode is executed in the chip and test results are output from the chip. It is provided that, after the setting and before the performance of the test mode, a check mode is executed in which the status of the test mode set in the chip is read out in a defined format.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.