Temperature measuring method, heat treating device and method, computer program, and radiation thermometer
US6860634B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 23, 2001 |
| Grant date | Mar 1, 2005 |
| Priority date | — |
| Expiry date | Oct 23, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/0846
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of temperature measurement for measuring a temperature of an object to be measured that is heated by a heating source in a multiplex-reflection environment by using two radiation thermometers provided at a measurement part separated from the object to be measured is provided. In the method, two of the radiation thermometers have a rod that is embedded in the measurement part and can receive radiation light from the object to be measured, and an optical fiber connected to the rod; numerical apertures of the radiation thermometers are different; the multiplex-reflection environment is formed between a surface of the measurement part facing the object to be measured and the measurement part; a radiation rate ε of the object to be measured based on a result of a measurement of two of the thermometers and the temperature of the object to be measured is calculated by the following equationsα=1−(1−NA·N1)N2/(D1/D2)εeff=(1−α)·ε+α·ε/{1−F·r·(1−ε)}wherein D1 represents a diameter of the rod of the radiation thermometers, NA represents the numerical aperture, D2 represents a distance between the object to be measured and the surface of the measurement part, r represents a reflectivity …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.