Inventor · Yokohama, JP

Takashi Shigeoka

16Patents
7h-index
33Co-inventors
62Inventor score

Filing activity: Mar 16, 2000 → Mar 15, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US6479801B1 Temperature measuring method, temperature control method and processing apparatus Physics 45 Expired
US6437290B1 Heat treatment apparatus having a thin light-transmitting window Chemistry; Metallurgy 25 Expired
US7717061B2 Gas switching mechanism for plasma processing apparatus Emerging Cross-Sectional Technologies 18 Active
US6876816B2 Heating device, heat treatment apparatus having the heating device and method for controlling heat treatment Electricity 14 Expired
US6891131B2 Thermal processing system Electricity 11 Expired
US6488407B1 Radiation temperature measuring method and radiation temperature measuring system Physics 9 Expired
US6641302B2 Thermal process apparatus for a semiconductor substrate Physics 8 Expired
US8907318B2 Resistance change memory Electricity 6 Active
US6467952B2 Virtual blackbody radiation system and radiation temperature measuring system Physics 6 Expired
US6825615B2 Lamp having a high-reflectance film for improving directivity of light and heat treatment apparatus having such a lamp Electricity 5 Expired
US8759806B2 Semiconductor memory device Electricity 4 Active
US8576606B2 Nonvolatile semiconductor memory device Emerging Cross-Sectional Technologies 3 Active
US6860634B2 Temperature measuring method, heat treating device and method, computer program, and radiation thermometer Physics 2 Expired
US8075698B2 Substrate processing unit, method of detecting end point of cleaning of substrate processing unit, and method of detecting end point of substrate processing Electricity 0 Active
US6534749B2 Thermal process apparatus for measuring accurate temperature by a radiation thermometer Mechanical Engineering; Lighting; Heating 0 Expired
US10896891B2 Semiconductor device Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.