Patent · US Expired

Test data generator

US6865707B2 · kind B2 · utility

3Cited by

4References

20Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Wolfgang Ernst · Munich, DE
Gunnar Krause · Munich, DE
Justus Kuhn · Birkenfeld, DE
Jens Luepke · Birkenfeld, DE
Jochen Mueller · Regensburg, DE
Peter Poechmueller · Burlington, US
Michael Schittenhelm · Poing, DE

Key dates

Filing date	Apr 1, 2002
Grant date	Mar 8, 2005
Priority date	—
Expiry date	Jun 7, 2023

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/36
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Test data generator for generating test data patterns for the testing of a circuit having a frequency multiplication circuit, which increases a low clock frequency of an input clock signal received by a test unit with a specific clock frequency multiplication factor. Also provided is a plurality of data registers for storing test data words read from the data registers, and multiplexer that switches through a test data word read from a data register with the high clock frequency of the output clock signal to a data bus in a way dependent on a register selection control datum of a multi-position register selection control data vector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.