Patent · US Expired

Process for manufacturing a semiconductor wafer integrating electronic devices including a structure for electromagnetic decoupling

US6869856B2 · kind B2 · utility

40Cited by
38References
38Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 29, 2002
Grant dateMar 22, 2005
Priority date
Expiry dateOct 29, 2022

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A process for manufacturing a semiconductor wafer integrating electronic devices and a structure for electromagnetic decoupling are disclosed. The method includes providing a wafer of semiconductor material having a substrate; forming a plurality of first mutually adjacent trenches, open on a first face of the wafer, which have a depth and a width and define walls); by thermal oxidation, completely oxidizing the walls and filling at least partially the first trenches, so as to form an insulating structure of dielectric material; and removing one portion of the substrate comprised between the insulating structure and a second face of the wafer, opposite to the first face of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.