Patent · US Expired

Memory device

US6873543B2 · kind B2 · utility

137Cited by
20References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 30, 2003
Grant dateMar 29, 2005
Priority date
Expiry dateOct 7, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/50
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the present invention provide a memory device. In one embodiment, the memory device comprises an array of memory cells configured to provide resistive states, a read circuit configured to sense the resistive states and a resistor. The resistor is configured to provide a resistance to the read circuit that is configured to select the resistor and sense the resistance to test the read circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.